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Page 1
CHAPTER 1 PROPERTIES OF X-RAYS 1–1 Introduction. X-rays were discovered
in 1895 by the German physicist Roentgen and were so named because their
nature was unknown at the time. Unlike ordinary light, these rays were invisible, ...
CHAPTER 1 PROPERTIES OF X-RAYS 1–1 Introduction. X-rays were discovered
in 1895 by the German physicist Roentgen and were so named because their
nature was unknown at the time. Unlike ordinary light, these rays were invisible, ...
Page 80
Now consider an imaginary experiment, in which ray 3 is allowed to continue in a
straight line but ray 2 is diverted by some means into a curved path before
rejoining ray 3. What is the situation on the wave front BB' where both rays are ...
Now consider an imaginary experiment, in which ray 3 is allowed to continue in a
straight line but ray 2 is diverted by some means into a curved path before
rejoining ray 3. What is the situation on the wave front BB' where both rays are ...
Page 82
the path difference for rays 1K1' and 2L2' is ML + LN = d' sin 6 + d' sin 6. This is
also the path difference for the overlapping rays scattered by S and P in the
direction shown, since in this direction there is no path difference between rays ...
the path difference for rays 1K1' and 2L2' is ML + LN = d' sin 6 + d' sin 6. This is
also the path difference for the overlapping rays scattered by S and P in the
direction shown, since in this direction there is no path difference between rays ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |