Elements of X-ray Diffraction |
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Page 227
... reference sphere with the incident beam . The projection of the pole N ' is therefore at P. From the measured distance OS of the diffraction spot from the center of the film , we can find the distance PQ of the projected pole from the ...
... reference sphere with the incident beam . The projection of the pole N ' is therefore at P. From the measured distance OS of the diffraction spot from the center of the film , we can find the distance PQ of the projected pole from the ...
Page 250
... reference line NS , as shown in Fig . 8-34 ( a ) . Then , if we make the projection plane parallel to the plane of ... reference line NS and the points A and B , located at an angle a N α N reference line H D E W G. 250 [ CHAP . 8 ...
... reference line NS , as shown in Fig . 8-34 ( a ) . Then , if we make the projection plane parallel to the plane of ... reference line NS and the points A and B , located at an angle a N α N reference line H D E W G. 250 [ CHAP . 8 ...
Page 457
... Reference books . Physical and mathematical data and informa- tion on specific crystal structures may be found in the following books : ( 1 ) Internationale Tabellen zur Bestimmung von ... REFERENCE BOOKS 18-3 Reference books.
... Reference books . Physical and mathematical data and informa- tion on specific crystal structures may be found in the following books : ( 1 ) Internationale Tabellen zur Bestimmung von ... REFERENCE BOOKS 18-3 Reference books.
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone