Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 86
Page 83
... planes of atoms within the crystal . It would be a mistake to assume , however , that a single plane of atoms A ... reflecting planes " and " reflected beams " when we really mean diffracting planes and diffracted beams . This is common ...
... planes of atoms within the crystal . It would be a mistake to assume , however , that a single plane of atoms A ... reflecting planes " and " reflected beams " when we really mean diffracting planes and diffracted beams . This is common ...
Page 124
... reflection can occur from their ( 100 ) planes . Other crystals of different orientation may be in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes . Since all these planes have the same spacing , the beams ...
... reflection can occur from their ( 100 ) planes . Other crystals of different orientation may be in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes . Since all these planes have the same spacing , the beams ...
Page 237
... reflection is produced , then the inclination of the reflecting planes to any chosen line or plane on the crystal surface is known from the position of the crystal . Two kinds of operation are required : ( 1 ) rotation of the crystal ...
... reflection is produced , then the inclination of the reflecting planes to any chosen line or plane on the crystal surface is known from the position of the crystal . Two kinds of operation are required : ( 1 ) rotation of the crystal ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone