Elements of X-ray Diffraction |
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Page 83
... reflection of visible light by mirrors appear very similar , since in both phenomena the angle of incidence is equal to the angle of reflection . It seems that we might regard the planes of atoms as little mirrors which " reflect " the ...
... reflection of visible light by mirrors appear very similar , since in both phenomena the angle of incidence is equal to the angle of reflection . It seems that we might regard the planes of atoms as little mirrors which " reflect " the ...
Page 124
... reflection can occur from their ( 100 ) planes . Other crystals of different orientation may be in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes . Since all these planes have the same spacing , the beams ...
... reflection can occur from their ( 100 ) planes . Other crystals of different orientation may be in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes . Since all these planes have the same spacing , the beams ...
Page 502
... reflection 120 20 S 20 So bi A CD B λ AK edge Ag ASWL SS 410 410 reflection FIG . A15-12 . Reciprocal - lattice treatment of the Laue method . ( S - So ) / λ = H. To these two extreme wavelengths correspond two extreme reflection b2 ...
... reflection 120 20 S 20 So bi A CD B λ AK edge Ag ASWL SS 410 410 reflection FIG . A15-12 . Reciprocal - lattice treatment of the Laue method . ( S - So ) / λ = H. To these two extreme wavelengths correspond two extreme reflection b2 ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone