Elements of X-ray Diffraction |
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Page 142
... region , as shown clearly in Fig . 3-6 ( a ) and ( b ) ; it is in this region also that the temperature - diffuse scattering is most intense . In both Laue methods , the short - wavelength radiation in the incident beam will cause most ...
... region , as shown clearly in Fig . 3-6 ( a ) and ( b ) ; it is in this region also that the temperature - diffuse scattering is most intense . In both Laue methods , the short - wavelength radiation in the incident beam will cause most ...
Page 347
... regions alternately . ( 3 ) Single - phase regions . In a single - phase region , a change in composi- tion generally produces a change in lattice parameter and therefore a shift in the positions of the diffraction lines of that phase ...
... regions alternately . ( 3 ) Single - phase regions . In a single - phase region , a change in composi- tion generally produces a change in lattice parameter and therefore a shift in the positions of the diffraction lines of that phase ...
Page 359
... region where the three phases , a , ẞ , and y , are in equi- librium . In a single - phase region the composition of the phase involved , say a , is continuously variable . In a two - phase region tie lines exist , just as in binary ...
... region where the three phases , a , ẞ , and y , are in equi- librium . In a single - phase region the composition of the phase involved , say a , is continuously variable . In a two - phase region tie lines exist , just as in binary ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone