Elements of X-ray Diffraction |
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Page 154
... relation to the incident beam , while the films laid out flat are indicated on the left . In ( a ) , a hole is punched in the center of the film so that the film may be slipped over the beam stop ; the transmitted beam thus leaves ...
... relation to the incident beam , while the films laid out flat are indicated on the left . In ( a ) , a hole is punched in the center of the film so that the film may be slipped over the beam stop ; the transmitted beam thus leaves ...
Page 174
... relation Exposure = ( intensity of x - ray beam ) ( time ) . Since the time is constant for all the diffraction lines on one film , this means that the photographic density is directly proportional to the x - ray in- tensity . Density ...
... relation Exposure = ( intensity of x - ray beam ) ( time ) . Since the time is constant for all the diffraction lines on one film , this means that the photographic density is directly proportional to the x - ray in- tensity . Density ...
Page 495
... relation between H and d , let n be a unit vector in the direction of H , i.e. , normal to ( hkl ) . Then But a1 d = ON = n . h H = H Therefore d = = = a1 H h a1 h 1 H · H ( hb1 + kb2 + lb3 ) H Used purely as a geometrical tool , the ...
... relation between H and d , let n be a unit vector in the direction of H , i.e. , normal to ( hkl ) . Then But a1 d = ON = n . h H = H Therefore d = = = a1 H h a1 h 1 H · H ( hb1 + kb2 + lb3 ) H Used purely as a geometrical tool , the ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone