## Elements of X-Ray Diffraction |

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Page 132

sin 6 cos 6 1 where / =

factor, p = multiplicity factor, and 6 = Bragg angle. In arriving at this equation, we

have omitted factors which are constant for all lines of the tern. For example, all ...

sin 6 cos 6 1 where / =

**relative**integrated intensity (arbitrary units), F = structurefactor, p = multiplicity factor, and 6 = Bragg angle. In arriving at this equation, we

have omitted factors which are constant for all lines of the tern. For example, all ...

Page 318

Since the

known for each line on the pattern, we can find the value of \F\ for each reflection

from Eq. (4-12). But \F\ measures only the

Since the

**relative**intensity /, the multiplicity factor p, and the Bragg angle 6 areknown for each line on the pattern, we can find the value of \F\ for each reflection

from Eq. (4-12). But \F\ measures only the

**relative**amplitude of each reflection, ...Page 382

Since a change in wavelength alters the

this means that a pattern made with Cu Ka radiation, for example, may not be

directly comparable with one in the file. Factors for converting intensities from a

Cu ...

Since a change in wavelength alters the

**relative**intensities of the diffraction lines,this means that a pattern made with Cu Ka radiation, for example, may not be

directly comparable with one in the file. Factors for converting intensities from a

Cu ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone