Elements of X-ray Diffraction |
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Page 132
... relative integrated intensity , i.e. , the relative area under the curve of in- tensity vs. 20 . It should be noted that " integrated intensity " is not really intensity , since intensity is expressed in terms of energy crossing unit ...
... relative integrated intensity , i.e. , the relative area under the curve of in- tensity vs. 20 . It should be noted that " integrated intensity " is not really intensity , since intensity is expressed in terms of energy crossing unit ...
Page 318
... relative amplitude of each reflection , whereas in order to use Eq . ( 4-11 ) for calculating atom positions , we must know the value of F , which measures both the amplitude and phase of one reflection relative to another . This is the ...
... relative amplitude of each reflection , whereas in order to use Eq . ( 4-11 ) for calculating atom positions , we must know the value of F , which measures both the amplitude and phase of one reflection relative to another . This is the ...
Page 382
... relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be directly comparable with one in the file . Factors for converting intensities from a Cu Ka to a Mo Ka basis ...
... relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be directly comparable with one in the file . Factors for converting intensities from a Cu Ka to a Mo Ka basis ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone