Elements of X-ray Diffraction |
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Page 407
... sample itself . Fluorescent radiation is produced not only at the surface of the sample but also in its interior , to a depth depending on the depth of effective penetration by the primary beam , which in turn depends on the over - all ...
... sample itself . Fluorescent radiation is produced not only at the surface of the sample but also in its interior , to a depth depending on the depth of effective penetration by the primary beam , which in turn depends on the over - all ...
Page 426
Bernard Dennis Cullity. the mass of sample per unit area and is given by the mass of the sample divided by the area of one face . = Since Mm varies with wa for samples of constant thickness , and may in fact vary independently of wa , it ...
Bernard Dennis Cullity. the mass of sample per unit area and is given by the mass of the sample divided by the area of one face . = Since Mm varies with wa for samples of constant thickness , and may in fact vary independently of wa , it ...
Page 429
... sample . The control channel is used to ensure that all samples receive the same total energy of incident radiation . No use is made of Eq . ( 16-4 ) . Instead , a calibration curve showing the relation between WA and In ( I1 / 12 ) is ...
... sample . The control channel is used to ensure that all samples receive the same total energy of incident radiation . No use is made of Eq . ( 16-4 ) . Instead , a calibration curve showing the relation between WA and In ( I1 / 12 ) is ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone