Elements of X-ray Diffraction |
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Page 301
... scale . A single setting of the C scale is then sought which will bring a set of integers on the C scale into coincidence with all the pencil marks on the D scale . Because of the systematic errors mentioned earlier , these coincidences ...
... scale . A single setting of the C scale is then sought which will bring a set of integers on the C scale into coincidence with all the pencil marks on the D scale . Because of the systematic errors mentioned earlier , these coincidences ...
Page 305
... scale is then constructed ; it extends over two ranges of the [ ( h2 + k2 ) + 12 / ( c / a ) 2 ] scale and runs in the opposite direction , since the coefficient of log d in Eq . ( 10-4 ) is 2 times the coefficient of log [ ( h2 + k2 ) ...
... scale is then constructed ; it extends over two ranges of the [ ( h2 + k2 ) + 12 / ( c / a ) 2 ] scale and runs in the opposite direction , since the coefficient of log d in Eq . ( 10-4 ) is 2 times the coefficient of log [ ( h2 + k2 ) ...
Page 307
... scale in Fig . 10-4 , which applies to body - centered tetragonal lattices . Note that the curves of high indices are often so crowded that it is difficult to assign the proper indices to the observed lines . It then becomes necessary ...
... scale in Fig . 10-4 , which applies to body - centered tetragonal lattices . Note that the curves of high indices are often so crowded that it is difficult to assign the proper indices to the observed lines . It then becomes necessary ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone