Elements of X-ray Diffraction |
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Page 108
... scattering cannot be prevented , however , and it has the undesirable effect of darkening the background of diffraction patterns . ( It should be noted that the quantum theory can account for both the coherent and the incoherent scattering ...
... scattering cannot be prevented , however , and it has the undesirable effect of darkening the background of diffraction patterns . ( It should be noted that the quantum theory can account for both the coherent and the incoherent scattering ...
Page 110
... scattering fac- tor of copper . The scattering just discussed , whose amplitude is expressed in terms of the atomic scattering factor , is coherent , or unmodified , scattering , which is the only kind capable of being diffracted . On ...
... scattering fac- tor of copper . The scattering just discussed , whose amplitude is expressed in terms of the atomic scattering factor , is coherent , or unmodified , scattering , which is the only kind capable of being diffracted . On ...
Page 488
... scattering power * with atomic number Z and with scattering angle 20 . The scattering power of an atom increases as Z increases and decreases as 20 increases , both for x - rays and for electrons , although not in exactly the same ...
... scattering power * with atomic number Z and with scattering angle 20 . The scattering power of an atom increases as Z increases and decreases as 20 increases , both for x - rays and for electrons , although not in exactly the same ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone