Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 89
Page 67
Bernard Dennis Cullity. sired angle measurement can then be made . Figure 2-31 ( a ) is a projec- tion of the two poles P1 and P2 shown in perspective in Fig . 2-26 , and the angle between them is found by the rotation illustrated in Fig ...
Bernard Dennis Cullity. sired angle measurement can then be made . Figure 2-31 ( a ) is a projec- tion of the two poles P1 and P2 shown in perspective in Fig . 2-26 , and the angle between them is found by the rotation illustrated in Fig ...
Page 146
... shown in Fig . 5-9 is given by 2v h = d ( 2/12 - 1 ) . и ( 5-6 ) In practice , v is very often about twice as large as u , which means that the conditions illustrated in Fig . 5-9 are achieved when the pinholes are about one - third the ...
... shown in Fig . 5-9 is given by 2v h = d ( 2/12 - 1 ) . и ( 5-6 ) In practice , v is very often about twice as large as u , which means that the conditions illustrated in Fig . 5-9 are achieved when the pinholes are about one - third the ...
Page 235
... shown in Fig . 8-19 in the form of a tracing yields the stereographic projection shown in Fig . 8-20 . The solid symbols in the latter are the poles of planes responsible for spots on the film and are numbered accordingly ; the open ...
... shown in Fig . 8-19 in the form of a tracing yields the stereographic projection shown in Fig . 8-20 . The solid symbols in the latter are the poles of planes responsible for spots on the film and are numbered accordingly ; the open ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone