Elements of X-ray Diffraction |
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Page 43
... shows two common structures based on the body - centered cubic ( BCC ) and face - centered cubic ( FCC ) lattices . The former has two atoms per unit cell and the latter four , as we can find by rewriting Eq . ( 2-1 ) in terms of the ...
... shows two common structures based on the body - centered cubic ( BCC ) and face - centered cubic ( FCC ) lattices . The former has two atoms per unit cell and the latter four , as we can find by rewriting Eq . ( 2-1 ) in terms of the ...
Page 151
... shows that AS , the separation of the lines on the film , increases with R. The resolving power may be obtained by differentiating the Bragg law : * λ do = = 2d sin 0 1 tan 0 . ( 6-2 ) d But dS do = dd R 20 + Therefore dS dd = 2R d FIG ...
... shows that AS , the separation of the lines on the film , increases with R. The resolving power may be obtained by differentiating the Bragg law : * λ do = = 2d sin 0 1 tan 0 . ( 6-2 ) d But dS do = dd R 20 + Therefore dS dd = 2R d FIG ...
Page 208
... shows that the probable error is less for high counting rates than for low , when the time constant remains the same . This is illustrated graphically in Fig . 7-23 , which shows how the recorded fluctuations in the counting rate ...
... shows that the probable error is less for high counting rates than for low , when the time constant remains the same . This is illustrated graphically in Fig . 7-23 , which shows how the recorded fluctuations in the counting rate ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone