Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 49
Page 52
... solution has solute atoms distributed more or less at random on the lattice points of the solvent . On the other hand , there are solutions in which this is true only at elevated temperatures ; when cooled to lower temperatures , the ...
... solution has solute atoms distributed more or less at random on the lattice points of the solvent . On the other hand , there are solutions in which this is true only at elevated temperatures ; when cooled to lower temperatures , the ...
Page 346
... solution in the A lattice , which may expand or contract as a result , depending on the relative sizes of the A and B atoms and the type of solid solution formed ( substi- tutional or interstitial ) . Ultimately the solubility limit of ...
... solution in the A lattice , which may expand or contract as a result , depending on the relative sizes of the A and B atoms and the type of solid solution formed ( substi- tutional or interstitial ) . Ultimately the solubility limit of ...
Page 353
... solution is interstitial or substitutional may be decided by determining whether the x - ray density calculated ... solution in the nickel - alu- minum system . A defect solution is disclosed by anomalies in the curves of density and ...
... solution is interstitial or substitutional may be decided by determining whether the x - ray density calculated ... solution in the nickel - alu- minum system . A defect solution is disclosed by anomalies in the curves of density and ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone