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Page 143
5-3 Specimen holders. Before going into the question of specimen holders, we
might consider the specimen itself. Obviously, a specimen for the transmission
method must have low enough absorption to transmit the diffracted beams; ...
5-3 Specimen holders. Before going into the question of specimen holders, we
might consider the specimen itself. Obviously, a specimen for the transmission
method must have low enough absorption to transmit the diffracted beams; ...
Page 164
Powder specimens may be prepared simply by spreading a bit of the powder
mixed with a binder on a glass slide or a ... There is an optimum specimen
thickness for the transmission method, because the diffracted beams will be very
weak or ...
Powder specimens may be prepared simply by spreading a bit of the powder
mixed with a binder on a glass slide or a ... There is an optimum specimen
thickness for the transmission method, because the diffracted beams will be very
weak or ...
Page 184
The powder should be ground extremely fine, to a size of 10 microns or less, if
relative line intensities are to be accurately reproducible; since the flat specimen
is not rotated as a Debye–Scherrer specimen is, the only way of obtaining an ...
The powder should be ground extremely fine, to a size of 10 microns or less, if
relative line intensities are to be accurately reproducible; since the flat specimen
is not rotated as a Debye–Scherrer specimen is, the only way of obtaining an ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |