## Elements of X-Ray Diffraction |

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Page 498

Therefore 2 sin 6 S - S0 H X d Of \ = 2d sin O.

Ewald construction. Section through the

incident and diffracted beam vectors. The conditions for diffraction expressed bv

Ea.

Therefore 2 sin 6 S - S0 H X d Of \ = 2d sin O.

**sphere**of reflection FIG. A15-8. TheEwald construction. Section through the

**sphere**of reflection containing theincident and diffracted beam vectors. The conditions for diffraction expressed bv

Ea.

Page 500

When the reciprocal lattice rotates, tEis plane cuts the reflection

small circle shown, and any points on the I = 1 layer which touch the

surface must touch it on this circle. Therefore all diffracted-beam ^vectors S/\ must

end ...

When the reciprocal lattice rotates, tEis plane cuts the reflection

**sphere**in thesmall circle shown, and any points on the I = 1 layer which touch the

**sphere**surface must touch it on this circle. Therefore all diffracted-beam ^vectors S/\ must

end ...

Page 502

Stated alternatively, contact between a fixed reciprocal-lattice point and the

There is therefore a whole set of reflection

different ...

Stated alternatively, contact between a fixed reciprocal-lattice point and the

**sphere**of reflection is produced by continuously varying the radius of the**sphere**.There is therefore a whole set of reflection

**spheres**, not just one; each has adifferent ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone