Elements of X-ray Diffraction |
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Page 153
... substances may produce split low - angle lines ( see Sec . 4-10 ) ; if this effect becomes troublesome , it may be eliminated by diluting the substance involved with some weakly absorbing substance , so that the absorption coefficient ...
... substances may produce split low - angle lines ( see Sec . 4-10 ) ; if this effect becomes troublesome , it may be eliminated by diluting the substance involved with some weakly absorbing substance , so that the absorption coefficient ...
Page 343
... substance and a pattern made of the composite powder . If the specimen is a polycrystal- line piece of metal , the standard powder may be mixed with petroleum jelly and smeared over the surface of the specimen in a thin film . The ...
... substance and a pattern made of the composite powder . If the specimen is a polycrystal- line piece of metal , the standard powder may be mixed with petroleum jelly and smeared over the surface of the specimen in a thin film . The ...
Page 378
... substance always produces a characteris- tic diffraction pattern , whether that substance is present in the pure state or as one constituent of a mixture of substances . This fact is the basis for the diffraction method of chemical ...
... substance always produces a characteris- tic diffraction pattern , whether that substance is present in the pure state or as one constituent of a mixture of substances . This fact is the basis for the diffraction method of chemical ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone