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Page 343
If the specimen whose parameter is to be determined is in the form of a powder, it
is simply mixed with the powdered standard substance and a pattern made of the
composite powder. If the specimen is a polycrystalline piece of metal, the ...
If the specimen whose parameter is to be determined is in the form of a powder, it
is simply mixed with the powdered standard substance and a pattern made of the
composite powder. If the specimen is a polycrystalline piece of metal, the ...
Page 378
A given substance always produces a characteristic diffraction pattern, whether
that substance is present in the pure state or as one constituent of a mixture of
substances. This fact is the basis for the diffraction method of chemical analysis.
A given substance always produces a characteristic diffraction pattern, whether
that substance is present in the pure state or as one constituent of a mixture of
substances. This fact is the basis for the diffraction method of chemical analysis.
Page 379
The powder pattern of a substance is characteristic of that substance and forms a
sort of fingerprint by which the substance may be identified. If we had on hand a
collection of diffraction patterns for a great many substances, we could identify ...
The powder pattern of a substance is characteristic of that substance and forms a
sort of fingerprint by which the substance may be identified. If we had on hand a
collection of diffraction patterns for a great many substances, we could identify ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |