Elements of X-ray Diffraction |
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Page 365
... superlattice lines , and their presence is direct evi- dence that ordering has taken place . The physical reason for the forma- tion of superlattice lines may be deduced from an examination of Fig . 13-1 . Consider reflection from the ...
... superlattice lines , and their presence is direct evi- dence that ordering has taken place . The physical reason for the forma- tion of superlattice lines may be deduced from an examination of Fig . 13-1 . Consider reflection from the ...
Page 367
... superlattice line is proportional to | F | 2 and therefore to S2 . For example , a decrease in order from S = 1.00 to S = 0.84 decreases the in- tensity of a superlattice line by about 30 percent . The weakening of super- lattice lines ...
... superlattice line is proportional to | F | 2 and therefore to S2 . For example , a decrease in order from S = 1.00 to S = 0.84 decreases the in- tensity of a superlattice line by about 30 percent . The weakening of super- lattice lines ...
Page 372
... superlattice lines . We have already seen that the intensity of a superlattice line from an ordered solid solution is much lower than that of a fundamental line . Will it ever be so low that the line cannot be detected ? We can make an ...
... superlattice lines . We have already seen that the intensity of a superlattice line from an ordered solid solution is much lower than that of a fundamental line . Will it ever be so low that the line cannot be detected ? We can make an ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone