Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 83
Page 269
... surface ground on a belt sander ; ( b ) after removal of 0.003 in . from this surface by etching . made at 300 ° and 450 ° C which would immediately suggest that the speci- men annealed at 450 ° C had the coarser grain size , but this ...
... surface ground on a belt sander ; ( b ) after removal of 0.003 in . from this surface by etching . made at 300 ° and 450 ° C which would immediately suggest that the speci- men annealed at 450 ° C had the coarser grain size , but this ...
Page 270
... surface discloses the cold- worked condition of a thin surface layer and gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective ...
... surface discloses the cold- worked condition of a thin surface layer and gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective ...
Page 387
... surface deposits . Metal surfaces frequently be- come contaminated , either by reaction of some substance with the base metal to produce a scale of oxide , sulfide , etc. , or by simple adherence of some foreign material . Detection and ...
... surface deposits . Metal surfaces frequently be- come contaminated , either by reaction of some substance with the base metal to produce a scale of oxide , sulfide , etc. , or by simple adherence of some foreign material . Detection and ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone