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Page 164
In back reflection, mounted metallographic specimens may be examined directly,
while the transmission method is of course restricted to wire and sheet
specimens which are not too highly absorbing. There is an optimum specimen
thickness ...
In back reflection, mounted metallographic specimens may be examined directly,
while the transmission method is of course restricted to wire and sheet
specimens which are not too highly absorbing. There is an optimum specimen
thickness ...
Page 189
We conclude that the absorption factor, 1/2u, is independent of 6 for a flat
specimen making equal angles with the incident and diffracted beams, provided
the specimen fills the incident beam at all angles and is effectively of infinite
thickness.
We conclude that the absorption factor, 1/2u, is independent of 6 for a flat
specimen making equal angles with the incident and diffracted beams, provided
the specimen fills the incident beam at all angles and is effectively of infinite
thickness.
Page 421
15-10 Measurement of coating thickness. Fluorescent radiation can be utilized
not only as a means of chemical analysis but also as a method for measuring the
thickness of surface layers. The following methods, both based on fluorescence,
...
15-10 Measurement of coating thickness. Fluorescent radiation can be utilized
not only as a means of chemical analysis but also as a method for measuring the
thickness of surface layers. The following methods, both based on fluorescence,
...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |