Elements of X-ray Diffraction |
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Page 164
... thickness for the transmission method , because the diffracted beams will be very weak or entirely absent if the specimen is either too thin ( insufficient volume of diffracting material ) or too thick ( excessive absorption ) . As will ...
... thickness for the transmission method , because the diffracted beams will be very weak or entirely absent if the specimen is either too thin ( insufficient volume of diffracting material ) or too thick ( excessive absorption ) . As will ...
Page 189
... thickness . * This * The criterion adopted for " infinite thickness " depends on the sensitivity of our intensity measurements or on what we regard as negligible diffracted intensity . For example , we might arbitrarily but quite ...
... thickness . * This * The criterion adopted for " infinite thickness " depends on the sensitivity of our intensity measurements or on what we regard as negligible diffracted intensity . For example , we might arbitrarily but quite ...
Page 421
... thickness . Fluorescent radiation can be utilized not only as a means of chemical analysis but also as a method for measuring the thickness of surface layers . The following methods , both ... THICKNESS 15-10 Measurement of coating thickness.
... thickness . Fluorescent radiation can be utilized not only as a means of chemical analysis but also as a method for measuring the thickness of surface layers . The following methods , both ... THICKNESS 15-10 Measurement of coating thickness.
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone