Elements of X-ray Diffraction |
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Page 55
... tion is ( a ) 180 ° rotation about an axis , called the twin axis , or ( b ) reflec- tion across a plane , called the twin plane . The plane on which the two parts of a twinned crystal are united is called the composition plane . In the ...
... tion is ( a ) 180 ° rotation about an axis , called the twin axis , or ( b ) reflec- tion across a plane , called the twin plane . The plane on which the two parts of a twinned crystal are united is called the composition plane . In the ...
Page 382
... tion of the pattern of the unknown . This may be done with a Debye- Scherrer camera or a diffractometer , and any convenient characteristic radiation as long as it is so chosen that fluorescence is minimized and an adequate number of ...
... tion of the pattern of the unknown . This may be done with a Debye- Scherrer camera or a diffractometer , and any convenient characteristic radiation as long as it is so chosen that fluorescence is minimized and an adequate number of ...
Page 415
... tion of the primary radiation traveling into the sample and in the absorp- tion of the fluorescent radiation traveling out . The absorption of the pri- mary radiation is difficult to calculate , because the part of that radiation ...
... tion of the primary radiation traveling into the sample and in the absorp- tion of the fluorescent radiation traveling out . The absorption of the pri- mary radiation is difficult to calculate , because the part of that radiation ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone