Elements of X-ray Diffraction |
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Page 36
... Primitive and nonprimitive cells . In any point lattice a unit cell may be chosen in an infinite number of ways and may contain one or more lattice points per cell . It is important to note that unit cells do not " exist " as such in a ...
... Primitive and nonprimitive cells . In any point lattice a unit cell may be chosen in an infinite number of ways and may contain one or more lattice points per cell . It is important to note that unit cells do not " exist " as such in a ...
Page 117
... + kvn + lwn ) ] . 1 One such term must be written down for each atom in the unit cell . In general , the summation will be a complex number of the form F = a + ib , where α = b = N Σƒn cos 24 ( 4-4 ] 117 SCATTERING BY A UNIT CELL.
... + kvn + lwn ) ] . 1 One such term must be written down for each atom in the unit cell . In general , the summation will be a complex number of the form F = a + ib , where α = b = N Σƒn cos 24 ( 4-4 ] 117 SCATTERING BY A UNIT CELL.
Page 317
... unit cell , calculated from the lattice parameters by means of the equations given in Appendix 1 , multiplied by the measured density of the substance equals the weight of all the atoms in the cell . From Eq . ( 3-9 ) , we have ΣΑ = PV ...
... unit cell , calculated from the lattice parameters by means of the equations given in Appendix 1 , multiplied by the measured density of the substance equals the weight of all the atoms in the cell . From Eq . ( 3-9 ) , we have ΣΑ = PV ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone