Elements of X-ray Diffraction |
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Page 115
... Vector addition of waves . T - 2i FIG . 4-12 . A wave vector in the complex plane . The two waves shown as full lines in Fig . 4-10 represent the variations in electric field intensity E with time t of two rays on any given wave front ...
... Vector addition of waves . T - 2i FIG . 4-12 . A wave vector in the complex plane . The two waves shown as full lines in Fig . 4-10 represent the variations in electric field intensity E with time t of two rays on any given wave front ...
Page 490
... vector algebra , namely , those involving the multiplication of vector quantities . The scalar product ( or dot product ) of two vectors * a and b , written a b , is a scalar quantity equal in magnitude to the product of the absolute ...
... vector algebra , namely , those involving the multiplication of vector quantities . The scalar product ( or dot product ) of two vectors * a and b , written a b , is a scalar quantity equal in magnitude to the product of the absolute ...
Page 498
... vector ( S- So ) bisects the angle between the incident beam So and the diffracted beam S. The diffracted beam S can ... vector is taken as the origin of the reciprocal lattice , drawn to the same scale as the vector So / A . A sphere of ...
... vector ( S- So ) bisects the angle between the incident beam So and the diffracted beam S. The diffracted beam S can ... vector is taken as the origin of the reciprocal lattice , drawn to the same scale as the vector So / A . A sphere of ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone