## Elements of X-Ray Diffraction |

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Page 115

2i wave

variations in electric field intensity E with time < of two rays on any given wave

front in a diffracted x-ray beam. Their equations may be written = AI sin (2*vt - E2

...

2i wave

**vector**in the The two waves shown as full lines in Fig. 4-10 represent thevariations in electric field intensity E with time < of two rays on any given wave

front in a diffracted x-ray beam. Their equations may be written = AI sin (2*vt - E2

...

Page 490

A15-2

of

involving the multiplication of

A15-2

**Vector**multiplication. Since the reciprocal lattice is best formulated in termsof

**vectors**, we shall first review a few theorems of**vector**algebra, namely, thoseinvolving the multiplication of

**vector**quantities. The scalar product (or dot ...Page 498

Equations (8) through (10) are the

Laue in 1912 to express the necessary conditions for diffraction. They must be

satisfied simultaneously for diffraction to occur. As shown in Fig. A15-7, the

(S ...

Equations (8) through (10) are the

**vector**form of the equations derived by vonLaue in 1912 to express the necessary conditions for diffraction. They must be

satisfied simultaneously for diffraction to occur. As shown in Fig. A15-7, the

**vector**(S ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone