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Page 19
One lead of the high-voltage transformer is connected to the filament and the
other to ground, the target being grounded by its own coolingwater connection.
The filament is heated by a filament current of about 3 amp and emits electrons
which ...
One lead of the high-voltage transformer is connected to the filament and the
other to ground, the target being grounded by its own coolingwater connection.
The filament is heated by a filament current of about 3 amp and emits electrons
which ...
Page 193
If the voltage on a proportional counter is increased some hundreds of volts, it will
act as a Geiger counter. The exact operating voltage is determined in the
following way. The counter is exposed to a beam of x-rays of constant intensity
and ...
If the voltage on a proportional counter is increased some hundreds of volts, it will
act as a Geiger counter. The exact operating voltage is determined in the
following way. The counter is exposed to a beam of x-rays of constant intensity
and ...
Page 199
the tube voltage exceeds the critical excitation voltage of the target material.
Suppose, for example, that a copper target (excitation voltage = 9 kv) is operated
at a peak voltage of 50 kv. Then, if the wave form is like that shown in Fig. 7–16,
Cu ...
the tube voltage exceeds the critical excitation voltage of the target material.
Suppose, for example, that a copper target (excitation voltage = 9 kv) is operated
at a peak voltage of 50 kv. Then, if the wave form is like that shown in Fig. 7–16,
Cu ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |