Elements of X-ray Diffraction |
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Page 5
... wavelength , called the short - wavelength limit ( AswL ) , increases rapidly to a maximum and then decreases , with no sharp limit on the long wavelength side . When the tube voltage is raised , the intensity of all wavelengths ...
... wavelength , called the short - wavelength limit ( AswL ) , increases rapidly to a maximum and then decreases , with no sharp limit on the long wavelength side . When the tube voltage is raised , the intensity of all wavelengths ...
Page 12
... wavelength less than a certain critical value . To say that the energy of the incoming quanta must exceed a certain value WK is equivalent to saying that the wavelength must be less than a certain value AK , since the energy per quantum ...
... wavelength less than a certain critical value . To say that the energy of the incoming quanta must exceed a certain value WK is equivalent to saying that the wavelength must be less than a certain value AK , since the energy per quantum ...
Page 414
... wavelength . In spectrometry , however , each spectral line has a different wavelength , and variations in counter behavior with wavelength must be considered . The pulse size is inversely proportional to x - ray wavelength in propor ...
... wavelength . In spectrometry , however , each spectral line has a different wavelength , and variations in counter behavior with wavelength must be considered . The pulse size is inversely proportional to x - ray wavelength in propor ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone