Elements of X-ray Diffraction |
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Page 1
Bernard Dennis Cullity. CHAPTER 1 PROPERTIES OF X - RAYS 1-1 Introduction . X - rays were discovered in 1895 by the German physicist Roentgen and were so named because their nature was unknown . at the time . Unlike ordinary light , these ...
Bernard Dennis Cullity. CHAPTER 1 PROPERTIES OF X - RAYS 1-1 Introduction . X - rays were discovered in 1895 by the German physicist Roentgen and were so named because their nature was unknown . at the time . Unlike ordinary light , these ...
Page 455
... X - Ray Crystallographic Technology , by André Guinier . ( Hilger and Watts ... diffraction . A considerable body of theory is presented , although this is ... diffraction by amorphous substances . Crystal - structure determination is not ...
... X - Ray Crystallographic Technology , by André Guinier . ( Hilger and Watts ... diffraction . A considerable body of theory is presented , although this is ... diffraction by amorphous substances . Crystal - structure determination is not ...
Page 487
... x - rays used in diffraction . The important fact to note about electrons is that they are much less penetrating than x - rays . They are easily absorbed by air , which means that the specimen and the photographic plate on which the ...
... x - rays used in diffraction . The important fact to note about electrons is that they are much less penetrating than x - rays . They are easily absorbed by air , which means that the specimen and the photographic plate on which the ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone