Elements of X-ray Diffraction |
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Page 355
... method is therefore governed by the sensitivity of the x - ray method in detecting small amounts of a second phase in a mixture , and this sensitivity varies widely from one alloy system to another . The intensity of a diffraction line ...
... method is therefore governed by the sensitivity of the x - ray method in detecting small amounts of a second phase in a mixture , and this sensitivity varies widely from one alloy system to another . The intensity of a diffraction line ...
Page 431
... procedure involving measurement of the strains produced by known stresses . X - ray diffraction can therefore be used as a method of " stress " measurement . Note , however , that stress is not measured directly by the x - ray method or ...
... procedure involving measurement of the strains produced by known stresses . X - ray diffraction can therefore be used as a method of " stress " measurement . Note , however , that stress is not measured directly by the x - ray method or ...
Page 451
... x - ray method will become evident if we compare its features with those of other methods of stress , or rather strain , measurement . If a camera with a pinhole col- limator is used , the incident x ... method is preferable whenever we wish ...
... x - ray method will become evident if we compare its features with those of other methods of stress , or rather strain , measurement . If a camera with a pinhole col- limator is used , the incident x ... method is preferable whenever we wish ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone