Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 92
... methods : λ 0 Laue method Rotating - crystal method Variable Fixed Fixed Variable ( in part ) Powder method Fixed Variable Laue Method The Laue method was the first diffraction method ever used , and it reproduces von Laue's original ...
... methods : λ 0 Laue method Rotating - crystal method Variable Fixed Fixed Variable ( in part ) Powder method Fixed Variable Laue Method The Laue method was the first diffraction method ever used , and it reproduces von Laue's original ...
Page 247
... Laue pattern shows only one spot , or none at all , from a low- index plane . Plane indexing can then be difficult . Methods of coping with this problem include the following : 1. The crystal is ... Laue method 247 Transmission Laue method.
... Laue pattern shows only one spot , or none at all , from a low- index plane . Plane indexing can then be difficult . Methods of coping with this problem include the following : 1. The crystal is ... Laue method 247 Transmission Laue method.
Page 260
... present in the incident beam do not cover an infinite range . There is no radiation of wavelength shorter than the short - wavelength limit , and 260 Orientation and quality of single crystals Crystal Quality Laue methods.
... present in the incident beam do not cover an infinite range . There is no radiation of wavelength shorter than the short - wavelength limit , and 260 Orientation and quality of single crystals Crystal Quality Laue methods.
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone