Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 343
... determined in this way , the number of atoms per cell is always an integer , within experimental error , except for ... Determination of atom positions 10-8 Determination of atom positions.
... determined in this way , the number of atoms per cell is always an integer , within experimental error , except for ... Determination of atom positions 10-8 Determination of atom positions.
Page 369
... determined by these means alone . X - ray diffraction , however , supplements these older techniques in many useful ways and provides , in addition , the only means of determining the crystal structures of the various phases involved ...
... determined by these means alone . X - ray diffraction , however , supplements these older techniques in many useful ways and provides , in addition , the only means of determining the crystal structures of the various phases involved ...
Page 474
... determined with the focusing technique of Fig . 16-7 is not expected to agree with the stress constant determined by the parallel - beam technique . The stress constant K appropriate to any technique can be usefully divided into two ...
... determined with the focusing technique of Fig . 16-7 is not expected to agree with the stress constant determined by the parallel - beam technique . The stress constant K appropriate to any technique can be usefully divided into two ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone