Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 12
... electron than by an M electron , and the result is that the Ka line is stronger than the Kẞ line . It also follows that it is impossible to excite one K line without exciting all the others . L characteristic lines originate in a ...
... electron than by an M electron , and the result is that the Ka line is stronger than the Kẞ line . It also follows that it is impossible to excite one K line without exciting all the others . L characteristic lines originate in a ...
Page 444
... electron microscope , if the latter is equipped with an x - ray spectrometer . These devices are collectively known as electron - column instruments . They all may be likened to elaborate x - ray tubes , in which the specimen is the ...
... electron microscope , if the latter is equipped with an x - ray spectrometer . These devices are collectively known as electron - column instruments . They all may be likened to elaborate x - ray tubes , in which the specimen is the ...
Page 498
... electron wavelength is about 0.04 Å , or considerably shorter than the wavelength of x - rays used in diffraction . Electron diffraction differs from x - ray diffraction in the following ways : 1. Electrons are much less penetrating ...
... electron wavelength is about 0.04 Å , or considerably shorter than the wavelength of x - rays used in diffraction . Electron diffraction differs from x - ray diffraction in the following ways : 1. Electrons are much less penetrating ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone