Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 353
Shrinkage of the film, caused by processing and drying, causes an error AS' in
the quantity S'. The camera radius may also be in error by an amount AR. The
effects of these two errors on the value of <f> may be found by writing Eq. (11-3)
in ...
Shrinkage of the film, caused by processing and drying, causes an error AS' in
the quantity S'. The camera radius may also be in error by an amount AR. The
effects of these two errors on the value of <f> may be found by writing Eq. (11-3)
in ...
Page 354
The error in 5' is then (AC + DB) = 2DB, which is approximately equal to 20N, or
AS' = 20N = 2A.v sin 2d). (11-6) The effect of a specimen displacement at right
angles to the incident beam [Fig. 1 1 -3(b)] is to shift the lines from A to C and
from ...
The error in 5' is then (AC + DB) = 2DB, which is approximately equal to 20N, or
AS' = 20N = 2A.v sin 2d). (11-6) The effect of a specimen displacement at right
angles to the incident beam [Fig. 1 1 -3(b)] is to shift the lines from A to C and
from ...
Page 359
The chief sources of systematic error are the following: 1. Film shrinkage. 2.
Incorrect specimen-to-film distance. 3. Absorption in the specimen. In this case it
may be shown that the fractional error in d is proportional to sin 4<f> tan <f>, or to
the ...
The chief sources of systematic error are the following: 1. Film shrinkage. 2.
Incorrect specimen-to-film distance. 3. Absorption in the specimen. In this case it
may be shown that the fractional error in d is proportional to sin 4<f> tan <f>, or to
the ...
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Contents
Geometry of Crystals | 32 |
Directions of Diffracted Beams | 81 |
EXPERIMENTAL METHODS | 147 |
Copyright | |
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Common terms and phrases
absorption coefficient alloy angular atomic number axes back-reflection body-centered Bragg angle Bragg law Bravais lattice calculated camera chart circle constant continuous spectrum copper cos2 counter cubic curve decreases density determined diffracted beam diffraction lines diffraction pattern diffraction spot diffractometer direction distance effect electron energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam integrated intensity lattice parameter lattice points Laue method Laue pattern Laue spot located measured metal obtained orientation parallel percent phase photographic plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig shows single crystal slit solid solution spacing specimen spectrometer sphere stereographic projection stress substance surface symmetry target temperature tetragonal texture thickness twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 2, illustrated, reprint |
| Publisher | Addison-Wesley Publishing Company, 1978 |
| Original from | the University of Michigan |
| Digitized | 15 Jul 2008 |
| ISBN | 0201011743, 9780201011746 |
| Length | 555 pages |
| Export Citation | BiBTeX EndNote RefMan |