Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 353
... error AS ' in the quantity S ' . The camera radius may also be in error by an amount AR . The effects of these two errors on the value of may be found by writing Eq . ( 11-3 ) in logarithmic form : In ф = In S ' - In 4 - In R ...
... error AS ' in the quantity S ' . The camera radius may also be in error by an amount AR . The effects of these two errors on the value of may be found by writing Eq . ( 11-3 ) in logarithmic form : In ф = In S ' - In 4 - In R ...
Page 354
... error in S ' is introduced by a right - angle displacement . The total error in S ' due to specimen displacement in some direction inclined to the incident beam is therefore given by Eq . ( 11-6 ) . This error in S ' causes an error in ...
... error in S ' is introduced by a right - angle displacement . The total error in S ' due to specimen displacement in some direction inclined to the incident beam is therefore given by Eq . ( 11-6 ) . This error in S ' causes an error in ...
Page 359
... error are the following : 1. Film shrinkage . 2. Incorrect specimen - to - film distance . 3. Absorption in the specimen . = In this case it may be shown that the fractional error in d is proportional to sin 40 tan 6 , or to the ...
... error are the following : 1. Film shrinkage . 2. Incorrect specimen - to - film distance . 3. Absorption in the specimen . = In this case it may be shown that the fractional error in d is proportional to sin 40 tan 6 , or to the ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone