Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 141
... gives the values of sin2 listed in column 4. In this and similar calculations , three - figure accuracy is ample ... give the first line an arbitrary intensity of 10 , i.e. , " normalized " to 10 for the first line . Column 14 : These ...
... gives the values of sin2 listed in column 4. In this and similar calculations , three - figure accuracy is ample ... give the first line an arbitrary intensity of 10 , i.e. , " normalized " to 10 for the first line . Column 14 : These ...
Page 292
... gives no information whatever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful manner , to ...
... gives no information whatever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful manner , to ...
Page 450
... gives the strain , and multiplication of the strain by Young's modulus E gives the applied stress . Residual stress is more difficult to measure , and there are only two practical methods of doing it : 1. X - ray diffraction . This ...
... gives the strain , and multiplication of the strain by Young's modulus E gives the applied stress . Residual stress is more difficult to measure , and there are only two practical methods of doing it : 1. X - ray diffraction . This ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone