Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 221
... integrated intensity of a diffraction line may be measured with a scaler by determining the average counting rate at several angular positions of the counter . The line profile , the curve of intensity vs. 20 , is then plotted on graph ...
... integrated intensity of a diffraction line may be measured with a scaler by determining the average counting rate at several angular positions of the counter . The line profile , the curve of intensity vs. 20 , is then plotted on graph ...
Page 292
... intensity of the incident beam is reduced almost to zero in a very short distance below the surface . The diffracted ... integrated intensity diffracted by an infinitesimally thin layer located at a depth x below the surface as d / p ...
... intensity of the incident beam is reduced almost to zero in a very short distance below the surface . The diffracted ... integrated intensity diffracted by an infinitesimally thin layer located at a depth x below the surface as d / p ...
Page 414
... integrated intensities of the two lines of the doublet , which is exactly what is done experimentally when the integrated intensity of an unresolved doublet is measured . For greatest accuracy in the calculation of F , the atomic ...
... integrated intensities of the two lines of the doublet , which is exactly what is done experimentally when the integrated intensity of an unresolved doublet is measured . For greatest accuracy in the calculation of F , the atomic ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone