Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 325
... known ( from the crystal system ) , and its size is calculable from the positions and Miller indices of the diffraction lines . 2. The number of atoms per unit cell is then computed from the shape and size of the unit cell , the ...
... known ( from the crystal system ) , and its size is calculable from the positions and Miller indices of the diffraction lines . 2. The number of atoms per unit cell is then computed from the shape and size of the unit cell , the ...
Page 344
... known structures he may be able to select a few likely candidates , and then proceed on the assumption that his unknown structure is the same as , or very similar to , one of these known ones . A great many known structures may be ...
... known structures he may be able to select a few likely candidates , and then proceed on the assumption that his unknown structure is the same as , or very similar to , one of these known ones . A great many known structures may be ...
Page 398
... known patterns one which matched the pattern of the unknown exactly . The collection of known patterns has to be fairly large , if it is to be at all useful , and then pattern- by - pattern comparison in order to find a matching one ...
... known patterns one which matched the pattern of the unknown exactly . The collection of known patterns has to be fairly large , if it is to be at all useful , and then pattern- by - pattern comparison in order to find a matching one ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone