Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 200
... less than 1 , apart because of their randomness in time . It follows that counting losses will occur at rates less than 1 / t , and that losses will increase as the rate increases , as shown in Fig . 7-10 . Here " quanta absorbed per ...
... less than 1 , apart because of their randomness in time . It follows that counting losses will occur at rates less than 1 / t , and that losses will increase as the rate increases , as shown in Fig . 7-10 . Here " quanta absorbed per ...
Page 206
... less than the input sensitivity of the counting circuit and no counts are observed . The pulse size and observed counting rate then increase rapidly with voltage up to the threshold of the plateau , where the counting rate is almost ...
... less than the input sensitivity of the counting circuit and no counts are observed . The pulse size and observed counting rate then increase rapidly with voltage up to the threshold of the plateau , where the counting rate is almost ...
Page 225
... less for high counting rates than for low , when the time constant remains the same ; this effect is evident on the chart recording of any diffraction line , where the pen fluctuations are smaller at the top of the line than in the ...
... less for high counting rates than for low , when the time constant remains the same ; this effect is evident on the chart recording of any diffraction line , where the pen fluctuations are smaller at the top of the line than in the ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone