Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 91
... obtained from the ( 100 ) planes by using a beam incident at the correct angle 01 , 02 , 03 , ... and pro- ducing first- , second- , third - , ... order reflections . But diffraction can also be produced by the ( 110 ) planes , the ...
... obtained from the ( 100 ) planes by using a beam incident at the correct angle 01 , 02 , 03 , ... and pro- ducing first- , second- , third - , ... order reflections . But diffraction can also be produced by the ( 110 ) planes , the ...
Page 141
... Obtained from Appendix 12 . Column 9 : Obtained from the relation F2 = 16fcu Column 10 : Obtained from Appendix 13 . Column 11 : Obtained from Appendix 14 . Column 12 : These values are the product of the values in columns 9 , 10 , and ...
... Obtained from Appendix 12 . Column 9 : Obtained from the relation F2 = 16fcu Column 10 : Obtained from Appendix 13 . Column 11 : Obtained from Appendix 14 . Column 12 : These values are the product of the values in columns 9 , 10 , and ...
Page 142
... obtained by multiplication of the above by its complex conjugate : | F | 2 = ( πί / 2 ) 16 [ fs + fzne ( xi / 2 ) ( h + k + 1 ) ] [ ƒs + fzne ( i / 2 ) ( h + k + 1 ) ] . This equation reduces to the following form : | F | 2 = 16 | ƒ } + ...
... obtained by multiplication of the above by its complex conjugate : | F | 2 = ( πί / 2 ) 16 [ fs + fzne ( xi / 2 ) ( h + k + 1 ) ] [ ƒs + fzne ( i / 2 ) ( h + k + 1 ) ] . This equation reduces to the following form : | F | 2 = 16 | ƒ } + ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone