Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 415
... sample to sample . With a known amount of original sample we mix a known amount of a standard substance S to form a new composite sample . Let CA and CA be the volume fractions of phase A in the original and composite samples ...
... sample to sample . With a known amount of original sample we mix a known amount of a standard substance S to form a new composite sample . Let CA and CA be the volume fractions of phase A in the original and composite samples ...
Page 430
... sample changers can sequentially put up to 60 samples into position . Unattended analysis of many samples for many elements is therefore possible . Multichannel Spectrometers These are automatic instruments which have as many channels ...
... sample changers can sequentially put up to 60 samples into position . Unattended analysis of many samples for many elements is therefore possible . Multichannel Spectrometers These are automatic instruments which have as many channels ...
Page 438
... samples of that class by means of a small on - line computer . They also compare experimental and cal- culated coefficients . See also various papers in [ 15.11 ] . Sample Preparation Solid samples must be surface ground or machined in ...
... samples of that class by means of a small on - line computer . They also compare experimental and cal- culated coefficients . See also various papers in [ 15.11 ] . Sample Preparation Solid samples must be surface ground or machined in ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone