Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 155
... SPECIMENS AND HOLDERS Obviously , a specimen for the transmission method must have low enough absorption to transmit the diffracted beams ; in practice , this means that relatively thick specimens of a light element like aluminum may be ...
... SPECIMENS AND HOLDERS Obviously , a specimen for the transmission method must have low enough absorption to transmit the diffracted beams ; in practice , this means that relatively thick specimens of a light element like aluminum may be ...
Page 176
... specimen can be prepared . However , the greatest utility of the pinhole method in metallurgical work lies in the fact that polycrystalline specimens can be examined directly . In back reflection , a metallographic specimen , mounted in ...
... specimen can be prepared . However , the greatest utility of the pinhole method in metallurgical work lies in the fact that polycrystalline specimens can be examined directly . In back reflection , a metallographic specimen , mounted in ...
Page 177
... specimen ; in this way , reference lines of known 0 value are formed on each film . When the pinhole method is used for parameter measurements , the film or specimen , or both , is moved during the exposure to produce smooth ...
... specimen ; in this way , reference lines of known 0 value are formed on each film . When the pinhole method is used for parameter measurements , the film or specimen , or both , is moved during the exposure to produce smooth ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone