Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 188
... spectrometer , briefly mentioned in Sec . 3-4 , has had a long and uneven history in the field of x - ray ... spectrometer has now become an instrument for control and analysis in a wide variety of industrial laboratories . Depending ...
... spectrometer , briefly mentioned in Sec . 3-4 , has had a long and uneven history in the field of x - ray ... spectrometer has now become an instrument for control and analysis in a wide variety of industrial laboratories . Depending ...
Page 421
... spectrometer is also called a crystal spectrom- eter . 2. Energy - dispersive . In this spectrometer , diffraction is not involved . The various wavelengths in the radiation emitted by the sample are separated on the basis of their ...
... spectrometer is also called a crystal spectrom- eter . 2. Energy - dispersive . In this spectrometer , diffraction is not involved . The various wavelengths in the radiation emitted by the sample are separated on the basis of their ...
Page 444
... spectrometer , because its whole purpose is chemical analysis . It came into general use in the early 1950s but is currently being replaced in many laboratories by spectrometer - equipped electron microscopes . Both the electron column ...
... spectrometer , because its whole purpose is chemical analysis . It came into general use in the early 1950s but is currently being replaced in many laboratories by spectrometer - equipped electron microscopes . Both the electron column ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone