Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Page 450
... stress in the outer regions is not only reduced to zero but is actually changed in sign , as indicated in ( c ) . The end result is that the un- loaded beam contains residual compressive stress in its top outside portion and residual ...
... stress in the outer regions is not only reduced to zero but is actually changed in sign , as indicated in ( c ) . The end result is that the un- loaded beam contains residual compressive stress in its top outside portion and residual ...
Page 453
... stress , do can be obtained from a measurement on the un- loaded specimen . ( Such a stress measurement is rarely made , and then only for certain research purposes ; it is far easier to measure applied stress with an electric ...
... stress , do can be obtained from a measurement on the un- loaded specimen . ( Such a stress measurement is rarely made , and then only for certain research purposes ; it is far easier to measure applied stress with an electric ...
Page 464
... stress and thereby change the stress to be measured . Grinding and machining are known to introduce large stresses to depths of at least 0.005 inch ( 125 μm ) . The effect of acid etching is less certain ; some investi- gators have ...
... stress and thereby change the stress to be measured . Grinding and machining are known to introduce large stresses to depths of at least 0.005 inch ( 125 μm ) . The effect of acid etching is less certain ; some investi- gators have ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone