Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |
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Results 1-3 of 43
Page 9
... voltage , i.e. , the voltage necessary to excite K characteristic radiation , is 20.01 kV for molybdenum , the K lines do not appear in the lower curves of Fig . 1-4 . An increase in voltage above the critical voltage increases the ...
... voltage , i.e. , the voltage necessary to excite K characteristic radiation , is 20.01 kV for molybdenum , the K lines do not appear in the lower curves of Fig . 1-4 . An increase in voltage above the critical voltage increases the ...
Page 22
... voltage stabilizers , are often used , particularly when the x - ray intensity must be kept constant within narrow limits . In Fig . 1-16 , the voltage applied to the tube is controlled by the autotransformer which controls the voltage ...
... voltage stabilizers , are often used , particularly when the x - ray intensity must be kept constant within narrow limits . In Fig . 1-16 , the voltage applied to the tube is controlled by the autotransformer which controls the voltage ...
Page 206
Bernard Dennis Cullity. Counting rate plateau operating voltage threshold Cu Ka Cr Κα starting voltage Counter voltage Fig . 7-16 Effect of voltage applied to proportional counter on observed counting rate at constant x - ray intensity ...
Bernard Dennis Cullity. Counting rate plateau operating voltage threshold Cu Ka Cr Κα starting voltage Counter voltage Fig . 7-16 Effect of voltage applied to proportional counter on observed counting rate at constant x - ray intensity ...
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Common terms and phrases
absorption alloy angle applied arrangement atoms axes axis calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor figure film given grain hexagonal incident beam increases indices intensity involved kind lattice Laue less located material means measured metal method normal Note observed obtained occur orientation origin parallel parameter particular pattern percent phase photographic plane pole position possible powder produced projection radiation rays reciprocal reference reflection region relation relative result rotation sample scattering sheet shown shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure surface temperature texture transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone