Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
From inside the book
Results 1-2 of 2
Page 149
... Debye and Scherrer in Germany and in 1917 by Hull in the United States . It is the most generally useful of all diffraction methods and , when properly employed , can yield a great deal of structural information about the material under ...
... Debye and Scherrer in Germany and in 1917 by Hull in the United States . It is the most generally useful of all diffraction methods and , when properly employed , can yield a great deal of structural information about the material under ...
Page 511
... Debye - Scherrer method , 329 , 330 diffractometer method , 334 pinhole method , 330 Face - centered cubic structure ... HULL , A. W. , 149 , 305 Hull - Davey chart , 305 IBM diffraction data cards , 386 Incoherent scattering , 108 , 111 ...
... Debye - Scherrer method , 329 , 330 diffractometer method , 334 pinhole method , 330 Face - centered cubic structure ... HULL , A. W. , 149 , 305 Hull - Davey chart , 305 IBM diffraction data cards , 386 Incoherent scattering , 108 , 111 ...
Other editions - View all
Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone