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Page 138
CHAPTER 5 LAUE PHOTOGRAPHS 5 – 1 Introduction . The experimental
methods used in obtaining diffraction patterns will be described in this chapter
and the two following ones . Here we are concerned with the Laue method only
from the ...
CHAPTER 5 LAUE PHOTOGRAPHS 5 – 1 Introduction . The experimental
methods used in obtaining diffraction patterns will be described in this chapter
and the two following ones . Here we are concerned with the Laue method only
from the ...
Page 147
Focusing of diffracted beam in the transmission Laue method . S = source , C =
crystal , F = focal point . from a small source , real or virtual . Each ray of the
incident beam which lies in the plane of the drawing strikes the reflecting lattice
planes ...
Focusing of diffracted beam in the transmission Laue method . S = source , C =
crystal , F = focal point . from a small source , real or virtual . Each ray of the
incident beam which lies in the plane of the drawing strikes the reflecting lattice
planes ...
Page 512
Lattice - parameter measurements , 324 with back - reflection focusing camera ,
333 with Debye - Scherrer camera , 326 with diffractometer , 334 with pinhole
camera , 333 LAUE , M . von , 78 , 367 , 457 Laue cameras , back - reflection ,
140 ...
Lattice - parameter measurements , 324 with back - reflection focusing camera ,
333 with Debye - Scherrer camera , 326 with diffractometer , 334 with pinhole
camera , 333 LAUE , M . von , 78 , 367 , 457 Laue cameras , back - reflection ,
140 ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |