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Page 41
These are called planes of a form , and the indices of any one plane , enclosed in
braces { hkl } , stand for the whole set . In general , planes of a form have the
same spacing but different Miller indices . For example , the faces of a cube , (
100 ) ...
These are called planes of a form , and the indices of any one plane , enclosed in
braces { hkl } , stand for the whole set . In general , planes of a form have the
same spacing but different Miller indices . For example , the faces of a cube , (
100 ) ...
Page 55
These , called twinned crystals , are fairly common both in minerals and in metals
and alloys The relationship between the two parts of a twinned crystal is
described by the symmetry operation which will bring one part into coincidence
with the ...
These , called twinned crystals , are fairly common both in minerals and in metals
and alloys The relationship between the two parts of a twinned crystal is
described by the symmetry operation which will bring one part into coincidence
with the ...
Page 193
This subtraction may be done electronically , in which case the composite circuit
is called a single - channel pulse - height analyzer . Such a device allows a
proportional counter to be operated under essentially monochromatic conditions .
This subtraction may be done electronically , in which case the composite circuit
is called a single - channel pulse - height analyzer . Such a device allows a
proportional counter to be operated under essentially monochromatic conditions .
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |