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Page 151
and AS = R420 , ( 6 - 1 ) where R is the radius of the camera . Two sets of planes
of very nearly the same spacing will give rise to two diffracted beams separated
by a small angle 420 ; for a given value of A20 , Eq . ( 6 - 1 ) shows that AS , the ...
and AS = R420 , ( 6 - 1 ) where R is the radius of the camera . Two sets of planes
of very nearly the same spacing will give rise to two diffracted beams separated
by a small angle 420 ; for a given value of A20 , Eq . ( 6 - 1 ) shows that AS , the ...
Page 156
6 – 5 Cameras for high and low temperatures . ... by quenching the specimen at a
high enough rate to suppress the decomposition of the high - temperature phase
and then examining the specimen in an ordinary camera at room temperature .
6 – 5 Cameras for high and low temperatures . ... by quenching the specimen at a
high enough rate to suppress the decomposition of the high - temperature phase
and then examining the specimen in an ordinary camera at room temperature .
Page 160
A powder specimen may also be used in this camera by fixing a thin layer of the
powder to a piece of paper with glue or petroleum jelly . The paper is then curved
and held against the camera circumference by an attachment provided with the ...
A powder specimen may also be used in this camera by fixing a thin layer of the
powder to a piece of paper with glue or petroleum jelly . The paper is then curved
and held against the camera circumference by an attachment provided with the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone