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Page 166
It cannot be employed with ferrous materials , however , since it will cause
fluorescent radiation from the iron in the specimen ; instead , Co Ka , Fe Ka or Cr
Ka radiation should be used . Precise lattice - parameter measurements require
that ...
It cannot be employed with ferrous materials , however , since it will cause
fluorescent radiation from the iron in the specimen ; instead , Co Ka , Fe Ka or Cr
Ka radiation should be used . Precise lattice - parameter measurements require
that ...
Page 167
the intensity of some of the short wavelengths which cause fluorescence , but it
will not , of course , eliminate them completely , particularly in the wavelength
region near 0 . 6A , where the intensity of the continuous spectrum is high and the
...
the intensity of some of the short wavelengths which cause fluorescence , but it
will not , of course , eliminate them completely , particularly in the wavelength
region near 0 . 6A , where the intensity of the continuous spectrum is high and the
...
Page 398
( Knowledge of the quartz content is important in industrial health programs ,
because inhaled quartz or other siliceous material is the cause of the lung
disease known as silicosis . ) In this analysis , fluorite ( CaF2 ) has been found to
be a ...
( Knowledge of the quartz content is important in industrial health programs ,
because inhaled quartz or other siliceous material is the cause of the lung
disease known as silicosis . ) In this analysis , fluorite ( CaF2 ) has been found to
be a ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |