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Results 1-3 of 83
Page 228
The distance PQ corresponding to each distance OS is then calculated from Eqs .
( 8 - 1 ) and ( 8 – 3 ) , and marked off from the center of the ruler in the opposite
direction . Corresponding graduations are given the same number and the result
...
The distance PQ corresponding to each distance OS is then calculated from Eqs .
( 8 - 1 ) and ( 8 – 3 ) , and marked off from the center of the ruler in the opposite
direction . Corresponding graduations are given the same number and the result
...
Page 305
Each set of indices hkl , as long as they correspond to planes of different spacing
, produces a different curve , and ... the same distance on the scale as the
horizontal separation , at the same c / a ratio , of the two corresponding curves on
the ...
Each set of indices hkl , as long as they correspond to planes of different spacing
, produces a different curve , and ... the same distance on the scale as the
horizontal separation , at the same c / a ratio , of the two corresponding curves on
the ...
Page 307
Vertical and horizontal movements correspond to trying various c / a and a values
, respectively , and the only restriction ... 10 – 3 , the indices of each line are
simply read from the corresponding curves , and the approximate value of c / a
from ...
Vertical and horizontal movements correspond to trying various c / a and a values
, respectively , and the only restriction ... 10 – 3 , the indices of each line are
simply read from the corresponding curves , and the approximate value of c / a
from ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |