Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 193
... counters . If the voltage on a proportional counter is in- creased some hundreds of volts , it will act as a Geiger counter . The exact operating voltage is determined in the following way . The counter is exposed to a beam of x - rays ...
... counters . If the voltage on a proportional counter is in- creased some hundreds of volts , it will act as a Geiger counter . The exact operating voltage is determined in the following way . The counter is exposed to a beam of x - rays ...
Page 194
... counter and that of a proportional counter : ( 1 ) The absorption of an x - ray quantum anywhere within the volume of a Geiger counter triggers an avalanche that extends over the whole length of the counter . ( 2 ) The gas amplification ...
... counter and that of a proportional counter : ( 1 ) The absorption of an x - ray quantum anywhere within the volume of a Geiger counter triggers an avalanche that extends over the whole length of the counter . ( 2 ) The gas amplification ...
Page 200
... counter and its associated circuits is given by the product of two efficiencies , that of quantum ab- sorption and that of quantum detection . The ... counters . This type of counter utilizes the 200 [ CHAP . 7 DIFFRACTOMETER MEASUREMENTS.
... counter and its associated circuits is given by the product of two efficiencies , that of quantum ab- sorption and that of quantum detection . The ... counters . This type of counter utilizes the 200 [ CHAP . 7 DIFFRACTOMETER MEASUREMENTS.
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosĀ² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone